The Mira 3-XMU field emission electron microscope is one of the newest and most advanced FESEM devices available in Iran and provides its users with the latest technology. The imaging detector (BSE-In beam, SE-In beam, SE, BSE) in addition to the imaging power up to 1000,000 times magnification, has the ability to image at high magnifications at very low voltages with optimal quality.
Another advantage of this device is that it is equipped with an LVSTD detector. This detector is capable of imaging under low vacuum and is therefore suitable for samples that are damaged under high vacuum, such as bio samples, polymeric materials, and samples with high porosity.
This device is also equipped with second-generation EDS microanalysis, which allows the identification of the smallest phases.Due to the ability to adjust the pressure inside the device's chamber and high resolution, it has the ability to work in all scientific and industrial fields, especially in the field of nanotechnology.
